Impact of operation parameters on the degradation of 233 nm AlGaN-based far-UVC LEDs

J. Glaab, J. Ruschel, N. Lobo Ploch, H.K. Cho, F. Mehnke, L. Sulmoni, M. Guttmann, T. Wernicke, M. Weyers, S. Einfeldt, M. Kneissl, J. Appl. Phys., vol. 131, no. 01, pp. 014501, doi:10.1063/5.0069590, (2022).